FEI Company

FEI Company

File:250px fei logo.gif
Company type	Public (Nasdaq: FEIC)
Industry	Scientific and Technical Instruments
Founded	1971
Headquarters	Hillsboro, Oregon , USA
Area served	global
Key people	Dr. Don R Kania, President and CEO Raymond A. Link, Executive Vice President and CFO Dr. Rob H.J. Fastenau, Executive Vice President; Marketing and Technology Robert S. Gregg, Executive Vice President of Worldwide Sales and Service Bradley J. Thies, Vice President, General Counsel
Products	Focused ion beam Scanning Electron Microscope Transmission Electron Microscope DualBeam™
Revenue	$479.5 Million USD (2006)
Net income	$20 Million USD (2006)
Number of employees	1,700 (2007)
Website	www.fei.com

FEI Company (Nasdaq: FEIC), founded in 1971, is a leading supplier of advanced Tools for Nanotech™ to a broad range of researchers, developers and manufacturers working on the nanoscale. Nanotechnology is the science of characterizing, analyzing and fabricating things smaller than 100 nanometers (a nanometer is one billionth of a meter). FEI's major markets are:

• NanoResearch & Industry, which includes a broad range of institutes, universities, national laboratories and industrial companies primarily performing research and development in material science

• NanoElectronics, which includes developers and manufacturers in the semiconductor, data storage and related fields

• NanoBiology, which includes institutes, universities, pharmaceutical companies and hospitals working in life sciences research and development.

FEI's tools feature advanced ion and electron-beam technologies that enable users to characterize, analyze and manipulate structures down to the sub-Angstrom scale. The company's systems include a line of DualBeam™ systems that combine ion and electron beams in a single system to provide 3D characterization, analysis and sample manipulation, scanning electron microscopes, transmission electron microscopes, focused ion beams, and the world's first commercially-available S/TEM microscope capable of sub-Angstrom resolution.

FEI maintains research and development centers in North America and Europe, and sales and service operations in more than 50 countries around the world.

Company History

2005

• FEI Introduces the Titan™ 80-300 kV TEM, the world's first, commercially-available transmission electron microscope capable of sub-Angstrom resolution in both TEM and STEM modes.

2004

• FEI breaks the 1 Ångström barrier with a 200 kV Tecnai™ with monochromator and Cs correction.

2001

• FEI introduces application-specific DualBeam™ systems for labs.
• First monochromated TEM.

2000

• First small-stage DualBeam™ launched.

1999

• FEI acquires Micrion Corporation and integrates product lines and operations.

1998

• FEI and Micrion separately offer head trimming solution for data storage manufacturing applications.
• All-in-one TEM (Tecnai) launched.

1997

• FEI and Philips Electron Optics merge.
• First in-line DualBeam™ for wafer fab shipped.

1996

• 5000th LMI source shipped by FEI.
• Micrion releases its 8000 Series FIB for IC mask repair.
• Philips Electron Optics acquires ElectroScan and its ESEM technology.
• Philips Electron Optics acquires Delmi in Brno, Czech Republic.

1995

• FEI ships 100th FIB workstation.

1993

• The first DualBeam™ (FIB/SEM) workstation is produced by FEI and Philips Electron Optics.

1990

• Philips Electron Optics introduces SEM for 6-inch semiconductor wafers.

1989

• FEI ships the first complete ion beam (FIB) workstation.

1985

• Micrion ships its first system

1983

• FEI ships first electro statically focused electron column.
• Micrion is founded to develop ion beam systems for mask repair.

1982

• FEI ships first LMI focusing column.

1981

• Liquid metal ion (LMI) sources are developed by FEI.

1971

• FEI is founded to provide high-purity, oriented single crystal materials for field emission research.

1958

• Philips Electron Optics breaks the 10 Ångström-barrier on a TEM with an EM200.

1949

• Philips Electron Optics (part of FEI Company since 1997) starts volume production of its first transmission electron microscope.

Application Areas

Semiconductor & Data Storage Circuit Edit 3D Metrology Defect Analysis Failure analysis Biology & Life Sciences Protein localization Electron tomography Cellular tomography Cryo-electron microscopy Toxicology Biological production and Viral load monitoring Particle analysis Pharmaceutical QC 3D tissue imaging Virology

Research Materials Qualification Materials and Sample Preparation Nanoprototyping Nanometrology Device Testing and Characterization Industry High-Resolution Imaging 2D & 3D Micro- Characterization Macro Sample to Nanometer Metrology Particle Detection and Characterization Direct Beam-Writing Fabrication Dynamic Materials Experiments Sample Preparation Forensics Mining (Mineral Liberation Analysis) Chemical/Petrochemical

External Links

• FEI Company